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authorSascha Hauer <s.hauer@pengutronix.de>2007-07-05 18:02:13 +0200
committerSascha Hauer <sha@octopus.labnet.pengutronix.de>2007-07-05 18:02:13 +0200
commit4b07af6730d2811363f158f5175138116038f7b9 (patch)
tree206044270884f80204a2da69e02ca3b6f5803185 /commands/memtest.c
parentd08c60e9d77dc0f83946cd702d383451865e66dd (diff)
downloadbarebox-4b07af6730d2811363f158f5175138116038f7b9.tar.gz
svn_rev_643
structure cleanup
Diffstat (limited to 'commands/memtest.c')
-rw-r--r--commands/memtest.c348
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+/*
+ * (C) Copyright 2000
+ * Wolfgang Denk, DENX Software Engineering, wd@denx.de.
+ *
+ * See file CREDITS for list of people who contributed to this
+ * project.
+ *
+ * This program is free software; you can redistribute it and/or
+ * modify it under the terms of the GNU General Public License as
+ * published by the Free Software Foundation; either version 2 of
+ * the License, or (at your option) any later version.
+ *
+ * This program is distributed in the hope that it will be useful,
+ * but WITHOUT ANY WARRANTY; without even the implied warranty of
+ * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
+ * GNU General Public License for more details.
+ *
+ * You should have received a copy of the GNU General Public License
+ * along with this program; if not, write to the Free Software
+ * Foundation, Inc., 59 Temple Place, Suite 330, Boston,
+ * MA 02111-1307 USA
+ */
+
+#include <common.h>
+#include <command.h>
+
+#ifdef CMD_MEM_DEBUG
+#define PRINTF(fmt,args...) printf (fmt ,##args)
+#else
+#define PRINTF(fmt,args...)
+#endif
+
+/*
+ * Perform a memory test. A more complete alternative test can be
+ * configured using CFG_ALT_MEMTEST. The complete test loops until
+ * interrupted by ctrl-c or by a failure of one of the sub-tests.
+ */
+
+int do_mem_mtest (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[])
+{
+ vu_long *addr, *start, *end;
+ ulong val;
+ ulong readback;
+
+#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
+ vu_long addr_mask;
+ vu_long offset;
+ vu_long test_offset;
+ vu_long pattern;
+ vu_long temp;
+ vu_long anti_pattern;
+ vu_long num_words;
+#ifdef GFG_MEMTEST_SCRATCH
+ vu_long *dummy = (vu_long*)CFG_MEMTEST_SCRATCH;
+#else
+ vu_long *dummy = 0; /* yes, this is address 0x0, not NULL */
+#endif
+ int j;
+ int iterations = 1;
+
+ static const ulong bitpattern[] = {
+ 0x00000001, /* single bit */
+ 0x00000003, /* two adjacent bits */
+ 0x00000007, /* three adjacent bits */
+ 0x0000000F, /* four adjacent bits */
+ 0x00000005, /* two non-adjacent bits */
+ 0x00000015, /* three non-adjacent bits */
+ 0x00000055, /* four non-adjacent bits */
+ 0xaaaaaaaa, /* alternating 1/0 */
+ };
+#else
+ ulong incr;
+ ulong pattern;
+ int rcode = 0;
+#endif
+
+ if (argc > 1) {
+ start = (ulong *)simple_strtoul(argv[1], NULL, 16);
+ } else {
+ start = (ulong *)CONFIG_CMD_MTEST_START;
+ }
+
+ if (argc > 2) {
+ end = (ulong *)simple_strtoul(argv[2], NULL, 16);
+ } else {
+ end = (ulong *)(CONFIG_CMD_MTEST_END);
+ }
+
+ if (argc > 3) {
+ pattern = (ulong)simple_strtoul(argv[3], NULL, 16);
+ } else {
+ pattern = 0;
+ }
+
+#if defined(CONFIG_CMD_MTEST_ALTERNATIVE)
+ printf ("Testing %08x ... %08x:\n", (uint)start, (uint)end);
+ PRINTF("%s:%d: start 0x%p end 0x%p\n",
+ __FUNCTION__, __LINE__, start, end);
+
+ for (;;) {
+ if (ctrlc()) {
+ putc ('\n');
+ return 1;
+ }
+
+ printf("Iteration: %6d\r", iterations);
+ PRINTF("Iteration: %6d\n", iterations);
+ iterations++;
+
+ /*
+ * Data line test: write a pattern to the first
+ * location, write the 1's complement to a 'parking'
+ * address (changes the state of the data bus so a
+ * floating bus doen't give a false OK), and then
+ * read the value back. Note that we read it back
+ * into a variable because the next time we read it,
+ * it might be right (been there, tough to explain to
+ * the quality guys why it prints a failure when the
+ * "is" and "should be" are obviously the same in the
+ * error message).
+ *
+ * Rather than exhaustively testing, we test some
+ * patterns by shifting '1' bits through a field of
+ * '0's and '0' bits through a field of '1's (i.e.
+ * pattern and ~pattern).
+ */
+ addr = start;
+ for (j = 0; j < sizeof(bitpattern)/sizeof(bitpattern[0]); j++) {
+ val = bitpattern[j];
+ for(; val != 0; val <<= 1) {
+ *addr = val;
+ *dummy = ~val; /* clear the test data off of the bus */
+ readback = *addr;
+ if(readback != val) {
+ printf ("FAILURE (data line): "
+ "expected %08lx, actual %08lx\n",
+ val, readback);
+ }
+ *addr = ~val;
+ *dummy = val;
+ readback = *addr;
+ if(readback != ~val) {
+ printf ("FAILURE (data line): "
+ "Is %08lx, should be %08lx\n",
+ readback, ~val);
+ }
+ }
+ }
+
+ /*
+ * Based on code whose Original Author and Copyright
+ * information follows: Copyright (c) 1998 by Michael
+ * Barr. This software is placed into the public
+ * domain and may be used for any purpose. However,
+ * this notice must not be changed or removed and no
+ * warranty is either expressed or implied by its
+ * publication or distribution.
+ */
+
+ /*
+ * Address line test
+ *
+ * Description: Test the address bus wiring in a
+ * memory region by performing a walking
+ * 1's test on the relevant bits of the
+ * address and checking for aliasing.
+ * This test will find single-bit
+ * address failures such as stuck -high,
+ * stuck-low, and shorted pins. The base
+ * address and size of the region are
+ * selected by the caller.
+ *
+ * Notes: For best results, the selected base
+ * address should have enough LSB 0's to
+ * guarantee single address bit changes.
+ * For example, to test a 64-Kbyte
+ * region, select a base address on a
+ * 64-Kbyte boundary. Also, select the
+ * region size as a power-of-two if at
+ * all possible.
+ *
+ * Returns: 0 if the test succeeds, 1 if the test fails.
+ *
+ * ## NOTE ## Be sure to specify start and end
+ * addresses such that addr_mask has
+ * lots of bits set. For example an
+ * address range of 01000000 02000000 is
+ * bad while a range of 01000000
+ * 01ffffff is perfect.
+ */
+ addr_mask = ((ulong)end - (ulong)start)/sizeof(vu_long);
+ pattern = (vu_long) 0xaaaaaaaa;
+ anti_pattern = (vu_long) 0x55555555;
+
+ PRINTF("%s:%d: addr mask = 0x%.8lx\n",
+ __FUNCTION__, __LINE__,
+ addr_mask);
+ /*
+ * Write the default pattern at each of the
+ * power-of-two offsets.
+ */
+ for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
+ start[offset] = pattern;
+ }
+
+ /*
+ * Check for address bits stuck high.
+ */
+ test_offset = 0;
+ start[test_offset] = anti_pattern;
+
+ for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
+ temp = start[offset];
+ if (temp != pattern) {
+ printf ("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
+ " expected 0x%.8lx, actual 0x%.8lx\n",
+ (ulong)&start[offset], pattern, temp);
+ return 1;
+ }
+ }
+ start[test_offset] = pattern;
+
+ /*
+ * Check for addr bits stuck low or shorted.
+ */
+ for (test_offset = 1; (test_offset & addr_mask) != 0; test_offset <<= 1) {
+ start[test_offset] = anti_pattern;
+
+ for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
+ temp = start[offset];
+ if ((temp != pattern) && (offset != test_offset)) {
+ printf ("\nFAILURE: Address bit stuck low or shorted @"
+ " 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
+ (ulong)&start[offset], pattern, temp);
+ return 1;
+ }
+ }
+ start[test_offset] = pattern;
+ }
+
+ /*
+ * Description: Test the integrity of a physical
+ * memory device by performing an
+ * increment/decrement test over the
+ * entire region. In the process every
+ * storage bit in the device is tested
+ * as a zero and a one. The base address
+ * and the size of the region are
+ * selected by the caller.
+ *
+ * Returns: 0 if the test succeeds, 1 if the test fails.
+ */
+ num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
+
+ /*
+ * Fill memory with a known pattern.
+ */
+ for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+ start[offset] = pattern;
+ }
+
+ /*
+ * Check each location and invert it for the second pass.
+ */
+ for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+ temp = start[offset];
+ if (temp != pattern) {
+ printf ("\nFAILURE (read/write) @ 0x%.8lx:"
+ " expected 0x%.8lx, actual 0x%.8lx)\n",
+ (ulong)&start[offset], pattern, temp);
+ return 1;
+ }
+
+ anti_pattern = ~pattern;
+ start[offset] = anti_pattern;
+ }
+
+ /*
+ * Check each location for the inverted pattern and zero it.
+ */
+ for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+ anti_pattern = ~pattern;
+ temp = start[offset];
+ if (temp != anti_pattern) {
+ printf ("\nFAILURE (read/write): @ 0x%.8lx:"
+ " expected 0x%.8lx, actual 0x%.8lx)\n",
+ (ulong)&start[offset], anti_pattern, temp);
+ return 1;
+ }
+ start[offset] = 0;
+ }
+ }
+
+#else /* The original, quickie test */
+ incr = 1;
+ for (;;) {
+ if (ctrlc()) {
+ putc ('\n');
+ return 1;
+ }
+
+ printf ("\rPattern %08lX Writing..."
+ "%12s"
+ "\b\b\b\b\b\b\b\b\b\b",
+ pattern, "");
+
+ for (addr=start,val=pattern; addr<end; addr++) {
+ *addr = val;
+ val += incr;
+ }
+
+ puts ("Reading...");
+
+ for (addr=start,val=pattern; addr<end; addr++) {
+ readback = *addr;
+ if (readback != val) {
+ printf ("\nMem error @ 0x%08X: "
+ "found %08lX, expected %08lX\n",
+ (uint)addr, readback, val);
+ rcode = 1;
+ }
+ val += incr;
+ }
+
+ /*
+ * Flip the pattern each time to make lots of zeros and
+ * then, the next time, lots of ones. We decrement
+ * the "negative" patterns and increment the "positive"
+ * patterns to preserve this feature.
+ */
+ if(pattern & 0x80000000) {
+ pattern = -pattern; /* complement & increment */
+ }
+ else {
+ pattern = ~pattern;
+ }
+ incr = -incr;
+ }
+ return rcode;
+#endif
+}
+
+U_BOOT_CMD(
+ mtest, 4, 0, do_mem_mtest,
+ "mtest - simple RAM test\n",
+ "[start [end [pattern]]]\n"
+ " - simple RAM read/write test\n"
+);