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authorAlexander Aring <alex.aring@gmail.com>2013-06-04 01:13:51 +0200
committerSascha Hauer <s.hauer@pengutronix.de>2013-06-05 22:54:35 +0200
commit3275c7ea43f366bcfac5a9f8ffc0d001592d9529 (patch)
treeb7a9eb666ca38843efc65954842ca592258ee1ec /common/memtest.c
parent47f9da43801d7a345569a35d23cd49eb355a891a (diff)
downloadbarebox-3275c7ea43f366bcfac5a9f8ffc0d001592d9529.tar.gz
common: add memtest.c with mem_test routine
Add mem_test routine. Useful to detect timing problems if someone porting a new device to barebox. This test includes a data bus test, address bus test and integrity check of memory. This mem_test routine has as parameter start and end address of testing space. The last parameter can skip the integrity check. Signed-off-by: Alexander Aring <alex.aring@gmail.com> Signed-off-by: Sascha Hauer <s.hauer@pengutronix.de>
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+/*
+ * memory_test.c
+ *
+ * Copyright (c) 2013 Alexander Aring <aar@pengutronix.de>, Pengutronix
+ *
+ * (C) Copyright 2000
+ * Wolfgang Denk, DENX Software Engineering, wd@denx.de.
+ *
+ * See file CREDITS for list of people who contributed to this
+ * project.
+ *
+ * This program is free software; you can redistribute it and/or modify
+ * it under the terms of the GNU General Public License version 2
+ * as published by the Free Software Foundation.
+ *
+ * This program is distributed in the hope that it will be useful,
+ * but WITHOUT ANY WARRANTY; without even the implied warranty of
+ * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
+ * GNU General Public License for more details.
+ *
+ */
+
+#include <progress.h>
+#include <common.h>
+#include <memory.h>
+#include <types.h>
+#include <sizes.h>
+#include <memtest.h>
+
+static const resource_size_t bitpattern[] = {
+ 0x00000001, /* single bit */
+ 0x00000003, /* two adjacent bits */
+ 0x00000007, /* three adjacent bits */
+ 0x0000000F, /* four adjacent bits */
+ 0x00000005, /* two non-adjacent bits */
+ 0x00000015, /* three non-adjacent bits */
+ 0x00000055, /* four non-adjacent bits */
+ 0xAAAAAAAA, /* alternating 1/0 */
+};
+
+/*
+ * Perform a memory test. The complete test
+ * loops until interrupted by ctrl-c.
+ *
+ * Prameters:
+ * start: start address for memory test.
+ * end: end address of memory test.
+ * bus_only: skip integrity check and do only a address/data bus
+ * testing.
+ *
+ * Return value can be -EINVAL for invalid parameter or -EINTR
+ * if memory test was interrupted.
+ */
+int mem_test(resource_size_t _start,
+ resource_size_t _end, int bus_only)
+{
+ volatile resource_size_t *start, *dummy, val, readback, offset,
+ offset2, pattern, temp, anti_pattern, num_words;
+ int i;
+
+ _start = ALIGN(_start, sizeof(resource_size_t));
+ _end = ALIGN_DOWN(_end, sizeof(resource_size_t)) - 1;
+
+ if (_end <= _start)
+ return -EINVAL;
+
+ start = (resource_size_t *)_start;
+ /*
+ * Point the dummy to start[1]
+ */
+ dummy = start + 1;
+ num_words = (_end - _start + 1)/sizeof(resource_size_t);
+
+ printf("Starting data line test.\n");
+
+ /*
+ * Data line test: write a pattern to the first
+ * location, write the 1's complement to a 'parking'
+ * address (changes the state of the data bus so a
+ * floating bus doen't give a false OK), and then
+ * read the value back. Note that we read it back
+ * into a variable because the next time we read it,
+ * it might be right (been there, tough to explain to
+ * the quality guys why it prints a failure when the
+ * "is" and "should be" are obviously the same in the
+ * error message).
+ *
+ * Rather than exhaustively testing, we test some
+ * patterns by shifting '1' bits through a field of
+ * '0's and '0' bits through a field of '1's (i.e.
+ * pattern and ~pattern).
+ */
+ for (i = 0; i < ARRAY_SIZE(bitpattern)/
+ sizeof(resource_size_t); i++) {
+ val = bitpattern[i];
+
+ for (; val != 0; val <<= 1) {
+ *start = val;
+ /* clear the test data off of the bus */
+ *dummy = ~val;
+ readback = *start;
+ if (readback != val) {
+ printf("FAILURE (data line): "
+ "expected 0x%08x, actual 0x%08x at address 0x%08x.\n",
+ val, readback, (resource_size_t)start);
+ return -EIO;
+ }
+
+ *start = ~val;
+ *dummy = val;
+ readback = *start;
+ if (readback != ~val) {
+ printf("FAILURE (data line): "
+ "Is 0x%08x, should be 0x%08x at address 0x%08x.\n",
+ readback,
+ ~val, (resource_size_t)start);
+ return -EIO;
+ }
+ }
+ }
+
+
+ /*
+ * Based on code whose Original Author and Copyright
+ * information follows: Copyright (c) 1998 by Michael
+ * Barr. This software is placed into the public
+ * domain and may be used for any purpose. However,
+ * this notice must not be changed or removed and no
+ * warranty is either expressed or implied by its
+ * publication or distribution.
+ */
+
+ /*
+ * Address line test
+ *
+ * Description: Test the address bus wiring in a
+ * memory region by performing a walking
+ * 1's test on the relevant bits of the
+ * address and checking for aliasing.
+ * This test will find single-bit
+ * address failures such as stuck -high,
+ * stuck-low, and shorted pins. The base
+ * address and size of the region are
+ * selected by the caller.
+ *
+ * Notes: For best results, the selected base
+ * address should have enough LSB 0's to
+ * guarantee single address bit changes.
+ * For example, to test a 64-Kbyte
+ * region, select a base address on a
+ * 64-Kbyte boundary. Also, select the
+ * region size as a power-of-two if at
+ * all possible.
+ *
+ * ## NOTE ## Be sure to specify start and end
+ * addresses such that num_words has
+ * lots of bits set. For example an
+ * address range of 01000000 02000000 is
+ * bad while a range of 01000000
+ * 01ffffff is perfect.
+ */
+
+ pattern = 0xAAAAAAAA;
+ anti_pattern = 0x55555555;
+
+ /*
+ * Write the default pattern at each of the
+ * power-of-two offsets.
+ */
+ for (offset = 1; offset <= num_words; offset <<= 1)
+ start[offset] = pattern;
+
+ printf("Check for address bits stuck high.\n");
+
+ /*
+ * Check for address bits stuck high.
+ */
+ for (offset = 1; offset <= num_words; offset <<= 1) {
+ temp = start[offset];
+ if (temp != pattern) {
+ printf("FAILURE: Address bit "
+ "stuck high @ 0x%08x:"
+ " expected 0x%08x, actual 0x%08x.\n",
+ (resource_size_t)&start[offset],
+ pattern, temp);
+ return -EIO;
+ }
+ }
+
+ printf("Check for address bits stuck "
+ "low or shorted.\n");
+
+ /*
+ * Check for address bits stuck low or shorted.
+ */
+ for (offset2 = 1; offset2 <= num_words; offset2 <<= 1) {
+ start[offset2] = anti_pattern;
+
+ for (offset = 1; offset <= num_words; offset <<= 1) {
+ temp = start[offset];
+
+ if ((temp != pattern) &&
+ (offset != offset2)) {
+ printf("FAILURE: Address bit stuck"
+ " low or shorted @"
+ " 0x%08x: expected 0x%08x, actual 0x%08x.\n",
+ (resource_size_t)&start[offset],
+ pattern, temp);
+ return -EIO;
+ }
+ }
+ start[offset2] = pattern;
+ }
+
+ /*
+ * We tested only the bus if != 0
+ * leaving here
+ */
+ if (bus_only)
+ return 0;
+
+ printf("Starting integrity check of physicaly ram.\n"
+ "Filling ram with patterns...\n");
+
+ /*
+ * Description: Test the integrity of a physical
+ * memory device by performing an
+ * increment/decrement test over the
+ * entire region. In the process every
+ * storage bit in the device is tested
+ * as a zero and a one. The base address
+ * and the size of the region are
+ * selected by the caller.
+ */
+
+ /*
+ * Fill memory with a known pattern.
+ */
+ init_progression_bar(num_words);
+ for (offset = 0; offset < num_words; offset++) {
+ /*
+ * Every 4K we update the progressbar.
+ */
+ if (!(offset & (SZ_4K - 1))) {
+ if (ctrlc())
+ return -EINTR;
+ show_progress(offset);
+ }
+
+ start[offset] = offset + 1;
+ }
+ show_progress(offset);
+
+ printf("\nCompare written patterns...\n");
+ /*
+ * Check each location and invert it for the second pass.
+ */
+ init_progression_bar(num_words - 1);
+ for (offset = 0; offset < num_words; offset++) {
+ if (!(offset & (SZ_4K - 1))) {
+ if (ctrlc())
+ return -EINTR;
+ show_progress(offset);
+ }
+
+ temp = start[offset];
+ if (temp != (offset + 1)) {
+ printf("\nFAILURE (read/write) @ 0x%08x:"
+ " expected 0x%08x, actual 0x%08x.\n",
+ (resource_size_t)&start[offset],
+ (offset + 1), temp);
+ return -EIO;
+ }
+
+ anti_pattern = ~(offset + 1);
+ start[offset] = anti_pattern;
+ }
+ show_progress(offset);
+
+ printf("\nFilling ram with inverted pattern and compare it...\n");
+ /*
+ * Check each location for the inverted pattern and zero it.
+ */
+ init_progression_bar(num_words - 1);
+ for (offset = 0; offset < num_words; offset++) {
+ if (!(offset & (SZ_4K - 1))) {
+ if (ctrlc())
+ return -EINTR;
+ show_progress(offset);
+ }
+
+ anti_pattern = ~(offset + 1);
+ temp = start[offset];
+
+ if (temp != anti_pattern) {
+ printf("\nFAILURE (read/write): @ 0x%08x:"
+ " expected 0x%08x, actual 0x%08x.\n",
+ (resource_size_t)&start[offset],
+ anti_pattern, temp);
+ return -EIO;
+ }
+
+ start[offset] = 0;
+ }
+ show_progress(offset);
+
+ /*
+ * end of progressbar
+ */
+ printf("\n");
+
+ return 0;
+}