From 4b07af6730d2811363f158f5175138116038f7b9 Mon Sep 17 00:00:00 2001 From: Sascha Hauer Date: Thu, 5 Jul 2007 18:02:13 +0200 Subject: svn_rev_643 structure cleanup --- commands/memtest.c | 348 +++++++++++++++++++++++++++++++++++++++++++++++++++++ 1 file changed, 348 insertions(+) create mode 100644 commands/memtest.c (limited to 'commands/memtest.c') diff --git a/commands/memtest.c b/commands/memtest.c new file mode 100644 index 0000000000..877e97a45c --- /dev/null +++ b/commands/memtest.c @@ -0,0 +1,348 @@ +/* + * (C) Copyright 2000 + * Wolfgang Denk, DENX Software Engineering, wd@denx.de. + * + * See file CREDITS for list of people who contributed to this + * project. + * + * This program is free software; you can redistribute it and/or + * modify it under the terms of the GNU General Public License as + * published by the Free Software Foundation; either version 2 of + * the License, or (at your option) any later version. + * + * This program is distributed in the hope that it will be useful, + * but WITHOUT ANY WARRANTY; without even the implied warranty of + * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the + * GNU General Public License for more details. + * + * You should have received a copy of the GNU General Public License + * along with this program; if not, write to the Free Software + * Foundation, Inc., 59 Temple Place, Suite 330, Boston, + * MA 02111-1307 USA + */ + +#include +#include + +#ifdef CMD_MEM_DEBUG +#define PRINTF(fmt,args...) printf (fmt ,##args) +#else +#define PRINTF(fmt,args...) +#endif + +/* + * Perform a memory test. A more complete alternative test can be + * configured using CFG_ALT_MEMTEST. The complete test loops until + * interrupted by ctrl-c or by a failure of one of the sub-tests. + */ + +int do_mem_mtest (cmd_tbl_t *cmdtp, int flag, int argc, char *argv[]) +{ + vu_long *addr, *start, *end; + ulong val; + ulong readback; + +#ifdef CONFIG_CMD_MTEST_ALTERNATIVE + vu_long addr_mask; + vu_long offset; + vu_long test_offset; + vu_long pattern; + vu_long temp; + vu_long anti_pattern; + vu_long num_words; +#ifdef GFG_MEMTEST_SCRATCH + vu_long *dummy = (vu_long*)CFG_MEMTEST_SCRATCH; +#else + vu_long *dummy = 0; /* yes, this is address 0x0, not NULL */ +#endif + int j; + int iterations = 1; + + static const ulong bitpattern[] = { + 0x00000001, /* single bit */ + 0x00000003, /* two adjacent bits */ + 0x00000007, /* three adjacent bits */ + 0x0000000F, /* four adjacent bits */ + 0x00000005, /* two non-adjacent bits */ + 0x00000015, /* three non-adjacent bits */ + 0x00000055, /* four non-adjacent bits */ + 0xaaaaaaaa, /* alternating 1/0 */ + }; +#else + ulong incr; + ulong pattern; + int rcode = 0; +#endif + + if (argc > 1) { + start = (ulong *)simple_strtoul(argv[1], NULL, 16); + } else { + start = (ulong *)CONFIG_CMD_MTEST_START; + } + + if (argc > 2) { + end = (ulong *)simple_strtoul(argv[2], NULL, 16); + } else { + end = (ulong *)(CONFIG_CMD_MTEST_END); + } + + if (argc > 3) { + pattern = (ulong)simple_strtoul(argv[3], NULL, 16); + } else { + pattern = 0; + } + +#if defined(CONFIG_CMD_MTEST_ALTERNATIVE) + printf ("Testing %08x ... %08x:\n", (uint)start, (uint)end); + PRINTF("%s:%d: start 0x%p end 0x%p\n", + __FUNCTION__, __LINE__, start, end); + + for (;;) { + if (ctrlc()) { + putc ('\n'); + return 1; + } + + printf("Iteration: %6d\r", iterations); + PRINTF("Iteration: %6d\n", iterations); + iterations++; + + /* + * Data line test: write a pattern to the first + * location, write the 1's complement to a 'parking' + * address (changes the state of the data bus so a + * floating bus doen't give a false OK), and then + * read the value back. Note that we read it back + * into a variable because the next time we read it, + * it might be right (been there, tough to explain to + * the quality guys why it prints a failure when the + * "is" and "should be" are obviously the same in the + * error message). + * + * Rather than exhaustively testing, we test some + * patterns by shifting '1' bits through a field of + * '0's and '0' bits through a field of '1's (i.e. + * pattern and ~pattern). + */ + addr = start; + for (j = 0; j < sizeof(bitpattern)/sizeof(bitpattern[0]); j++) { + val = bitpattern[j]; + for(; val != 0; val <<= 1) { + *addr = val; + *dummy = ~val; /* clear the test data off of the bus */ + readback = *addr; + if(readback != val) { + printf ("FAILURE (data line): " + "expected %08lx, actual %08lx\n", + val, readback); + } + *addr = ~val; + *dummy = val; + readback = *addr; + if(readback != ~val) { + printf ("FAILURE (data line): " + "Is %08lx, should be %08lx\n", + readback, ~val); + } + } + } + + /* + * Based on code whose Original Author and Copyright + * information follows: Copyright (c) 1998 by Michael + * Barr. This software is placed into the public + * domain and may be used for any purpose. However, + * this notice must not be changed or removed and no + * warranty is either expressed or implied by its + * publication or distribution. + */ + + /* + * Address line test + * + * Description: Test the address bus wiring in a + * memory region by performing a walking + * 1's test on the relevant bits of the + * address and checking for aliasing. + * This test will find single-bit + * address failures such as stuck -high, + * stuck-low, and shorted pins. The base + * address and size of the region are + * selected by the caller. + * + * Notes: For best results, the selected base + * address should have enough LSB 0's to + * guarantee single address bit changes. + * For example, to test a 64-Kbyte + * region, select a base address on a + * 64-Kbyte boundary. Also, select the + * region size as a power-of-two if at + * all possible. + * + * Returns: 0 if the test succeeds, 1 if the test fails. + * + * ## NOTE ## Be sure to specify start and end + * addresses such that addr_mask has + * lots of bits set. For example an + * address range of 01000000 02000000 is + * bad while a range of 01000000 + * 01ffffff is perfect. + */ + addr_mask = ((ulong)end - (ulong)start)/sizeof(vu_long); + pattern = (vu_long) 0xaaaaaaaa; + anti_pattern = (vu_long) 0x55555555; + + PRINTF("%s:%d: addr mask = 0x%.8lx\n", + __FUNCTION__, __LINE__, + addr_mask); + /* + * Write the default pattern at each of the + * power-of-two offsets. + */ + for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) { + start[offset] = pattern; + } + + /* + * Check for address bits stuck high. + */ + test_offset = 0; + start[test_offset] = anti_pattern; + + for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) { + temp = start[offset]; + if (temp != pattern) { + printf ("\nFAILURE: Address bit stuck high @ 0x%.8lx:" + " expected 0x%.8lx, actual 0x%.8lx\n", + (ulong)&start[offset], pattern, temp); + return 1; + } + } + start[test_offset] = pattern; + + /* + * Check for addr bits stuck low or shorted. + */ + for (test_offset = 1; (test_offset & addr_mask) != 0; test_offset <<= 1) { + start[test_offset] = anti_pattern; + + for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) { + temp = start[offset]; + if ((temp != pattern) && (offset != test_offset)) { + printf ("\nFAILURE: Address bit stuck low or shorted @" + " 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n", + (ulong)&start[offset], pattern, temp); + return 1; + } + } + start[test_offset] = pattern; + } + + /* + * Description: Test the integrity of a physical + * memory device by performing an + * increment/decrement test over the + * entire region. In the process every + * storage bit in the device is tested + * as a zero and a one. The base address + * and the size of the region are + * selected by the caller. + * + * Returns: 0 if the test succeeds, 1 if the test fails. + */ + num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1; + + /* + * Fill memory with a known pattern. + */ + for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) { + start[offset] = pattern; + } + + /* + * Check each location and invert it for the second pass. + */ + for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) { + temp = start[offset]; + if (temp != pattern) { + printf ("\nFAILURE (read/write) @ 0x%.8lx:" + " expected 0x%.8lx, actual 0x%.8lx)\n", + (ulong)&start[offset], pattern, temp); + return 1; + } + + anti_pattern = ~pattern; + start[offset] = anti_pattern; + } + + /* + * Check each location for the inverted pattern and zero it. + */ + for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) { + anti_pattern = ~pattern; + temp = start[offset]; + if (temp != anti_pattern) { + printf ("\nFAILURE (read/write): @ 0x%.8lx:" + " expected 0x%.8lx, actual 0x%.8lx)\n", + (ulong)&start[offset], anti_pattern, temp); + return 1; + } + start[offset] = 0; + } + } + +#else /* The original, quickie test */ + incr = 1; + for (;;) { + if (ctrlc()) { + putc ('\n'); + return 1; + } + + printf ("\rPattern %08lX Writing..." + "%12s" + "\b\b\b\b\b\b\b\b\b\b", + pattern, ""); + + for (addr=start,val=pattern; addr