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authorSascha Hauer <s.hauer@pengutronix.de>2013-07-01 09:37:37 +0200
committerSascha Hauer <s.hauer@pengutronix.de>2013-07-01 09:37:37 +0200
commit44ebe21a33211961a573a7566801f81423928449 (patch)
tree09a64c6af90ac3b60bc3fc4511b3ef172d464582
parentbe1ebac4291ddbc6920e63d18ab92292528d1683 (diff)
parent842308e29774c577291cae09a8a71ecc3b708b92 (diff)
downloadbarebox-44ebe21a33211961a573a7566801f81423928449.tar.gz
barebox-44ebe21a33211961a573a7566801f81423928449.tar.xz
Merge branch 'for-next/memtest'
-rw-r--r--commands/Kconfig17
-rw-r--r--commands/Makefile2
-rw-r--r--commands/memtest.c492
-rw-r--r--common/Makefile1
-rw-r--r--common/memtest.c313
-rw-r--r--include/common.h5
-rw-r--r--include/memtest.h14
7 files changed, 538 insertions, 306 deletions
diff --git a/commands/Kconfig b/commands/Kconfig
index 384643bf41..7cc71298b7 100644
--- a/commands/Kconfig
+++ b/commands/Kconfig
@@ -562,14 +562,15 @@ config CMD_NANDTEST
select PARTITION_NEED_MTD
prompt "nandtest"
-config CMD_MTEST
- tristate
- prompt "mtest"
-
-config CMD_MTEST_ALTERNATIVE
- bool
- depends on CMD_MTEST
- prompt "alternative mtest implementation"
+config CMD_MEMTEST
+ tristate
+ prompt "memtest"
+ help
+ The memtest command can test the registered barebox memory.
+ During this test barebox memory regions like heap, stack, ...
+ will be skipped. If the tested architecture has MMU with PTE
+ flags support, the memtest is running twice with cache enabled
+ and with cache disabled
endmenu
diff --git a/commands/Makefile b/commands/Makefile
index 419d93bc0e..6acffc8284 100644
--- a/commands/Makefile
+++ b/commands/Makefile
@@ -13,7 +13,6 @@ obj-$(CONFIG_CMD_MW) += mw.o
obj-$(CONFIG_CMD_MEMCMP) += memcmp.o
obj-$(CONFIG_CMD_MEMCPY) += memcpy.o
obj-$(CONFIG_CMD_MEMSET) += memset.o
-obj-$(CONFIG_CMD_MTEST) += memtest.o
obj-$(CONFIG_CMD_EDIT) += edit.o
obj-$(CONFIG_CMD_EXEC) += exec.o
obj-$(CONFIG_CMD_SLEEP) += sleep.o
@@ -49,6 +48,7 @@ obj-$(CONFIG_CMD_SAVEENV) += saveenv.o
obj-$(CONFIG_CMD_LOADENV) += loadenv.o
obj-$(CONFIG_CMD_NAND) += nand.o
obj-$(CONFIG_CMD_NANDTEST) += nandtest.o
+obj-$(CONFIG_CMD_MEMTEST) += memtest.o
obj-$(CONFIG_CMD_TRUE) += true.o
obj-$(CONFIG_CMD_FALSE) += false.o
obj-$(CONFIG_CMD_VERSION) += version.o
diff --git a/commands/memtest.c b/commands/memtest.c
index 2d64d00a99..d2a148761b 100644
--- a/commands/memtest.c
+++ b/commands/memtest.c
@@ -1,8 +1,8 @@
/*
- * mtest - Perform a memory test
+ * memtest - Perform a memory test
*
- * (C) Copyright 2000
- * Wolfgang Denk, DENX Software Engineering, wd@denx.de.
+ * (C) Copyright 2013
+ * Alexander Aring <aar@pengutronix.de>, Pengutronix
*
* See file CREDITS for list of people who contributed to this
* project.
@@ -17,335 +17,237 @@
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
* GNU General Public License for more details.
*
+ * You should have received a copy of the GNU General Public License
+ * along with this program; if not, write to the Free Software
+ * Foundation, Inc., 59 Temple Place, Suite 330, Boston,
+ * MA 02111-1307 USA
*/
-#include <common.h>
#include <command.h>
-#include <types.h>
+#include <getopt.h>
+#include <asm/mmu.h>
+#include <memory.h>
+#include <malloc.h>
+#include <common.h>
+#include <errno.h>
-/*
- * Perform a memory test. A more complete alternative test can be
- * configured using CONFIG_CMD_MTEST_ALTERNATIVE. The complete test
- * loops until interrupted by ctrl-c or by a failure of one of the
- * sub-tests.
- */
-#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
-static int mem_test(ulong _start, ulong _end, ulong pattern_unused)
+#include <memtest.h>
+
+static int alloc_memtest_region(struct list_head *list,
+ resource_size_t start, resource_size_t size)
{
- vu_long *start = (vu_long *)_start;
- vu_long *end = (vu_long *)_end;
- vu_long *addr;
- ulong val;
- ulong readback;
- vu_long addr_mask;
- vu_long offset;
- vu_long test_offset;
- vu_long pattern;
- vu_long temp;
- vu_long anti_pattern;
- vu_long num_words;
-#ifdef CFG_MEMTEST_SCRATCH
- vu_long *dummy = (vu_long*)CFG_MEMTEST_SCRATCH;
-#else
- vu_long *dummy = start;
-#endif
- int j;
- int iterations = 1;
-
- static const ulong bitpattern[] = {
- 0x00000001, /* single bit */
- 0x00000003, /* two adjacent bits */
- 0x00000007, /* three adjacent bits */
- 0x0000000F, /* four adjacent bits */
- 0x00000005, /* two non-adjacent bits */
- 0x00000015, /* three non-adjacent bits */
- 0x00000055, /* four non-adjacent bits */
- 0xaaaaaaaa, /* alternating 1/0 */
- };
-
- /* XXX: enforce alignment of start and end? */
- for (;;) {
- if (ctrlc()) {
- putchar ('\n');
- return 1;
- }
+ struct resource *r_new;
+ struct mem_test_resource *r;
- printf("Iteration: %6d\r", iterations);
- iterations++;
+ r = xzalloc(sizeof(struct mem_test_resource));
+ r_new = request_sdram_region("memtest", start, size);
+ if (!r_new)
+ return -EINVAL;
- /*
- * Data line test: write a pattern to the first
- * location, write the 1's complement to a 'parking'
- * address (changes the state of the data bus so a
- * floating bus doen't give a false OK), and then
- * read the value back. Note that we read it back
- * into a variable because the next time we read it,
- * it might be right (been there, tough to explain to
- * the quality guys why it prints a failure when the
- * "is" and "should be" are obviously the same in the
- * error message).
- *
- * Rather than exhaustively testing, we test some
- * patterns by shifting '1' bits through a field of
- * '0's and '0' bits through a field of '1's (i.e.
- * pattern and ~pattern).
- */
- addr = start;
- /* XXX */
- if (addr == dummy) ++addr;
- for (j = 0; j < sizeof(bitpattern)/sizeof(bitpattern[0]); j++) {
- val = bitpattern[j];
- for(; val != 0; val <<= 1) {
- *addr = val;
- *dummy = ~val; /* clear the test data off of the bus */
- readback = *addr;
- if(readback != val) {
- printf ("FAILURE (data line): "
- "expected 0x%08lx, actual 0x%08lx at address 0x%p\n",
- val, readback, addr);
- }
- *addr = ~val;
- *dummy = val;
- readback = *addr;
- if(readback != ~val) {
- printf ("FAILURE (data line): "
- "Is 0x%08lx, should be 0x%08lx at address 0x%p\n",
- readback, ~val, addr);
- }
- }
- }
+ r->r = r_new;
+ list_add_tail(&r->list, list);
- /*
- * Based on code whose Original Author and Copyright
- * information follows: Copyright (c) 1998 by Michael
- * Barr. This software is placed into the public
- * domain and may be used for any purpose. However,
- * this notice must not be changed or removed and no
- * warranty is either expressed or implied by its
- * publication or distribution.
- */
+ return 0;
+}
- /*
- * Address line test
- *
- * Description: Test the address bus wiring in a
- * memory region by performing a walking
- * 1's test on the relevant bits of the
- * address and checking for aliasing.
- * This test will find single-bit
- * address failures such as stuck -high,
- * stuck-low, and shorted pins. The base
- * address and size of the region are
- * selected by the caller.
- *
- * Notes: For best results, the selected base
- * address should have enough LSB 0's to
- * guarantee single address bit changes.
- * For example, to test a 64-Kbyte
- * region, select a base address on a
- * 64-Kbyte boundary. Also, select the
- * region size as a power-of-two if at
- * all possible.
- *
- * Returns: 0 if the test succeeds, 1 if the test fails.
- *
- * ## NOTE ## Be sure to specify start and end
- * addresses such that addr_mask has
- * lots of bits set. For example an
- * address range of 01000000 02000000 is
- * bad while a range of 01000000
- * 01ffffff is perfect.
- */
- addr_mask = ((ulong)end - (ulong)start)/sizeof(vu_long);
- pattern = (vu_long) 0xaaaaaaaa;
- anti_pattern = (vu_long) 0x55555555;
+static int request_memtest_regions(struct list_head *list)
+{
+ int ret;
+ struct memory_bank *bank;
+ struct resource *r, *r_prev = NULL;
+ resource_size_t start, end, size;
- debug("%s:%d: addr mask = 0x%.8lx\n",
- __FUNCTION__, __LINE__,
- addr_mask);
+ for_each_memory_bank(bank) {
/*
- * Write the default pattern at each of the
- * power-of-two offsets.
+ * If we don't have any allocated region on bank,
+ * we use the whole bank boundary
*/
- for (offset = 1; (offset & addr_mask) != 0; offset <<= 1)
- start[offset] = pattern;
+ if (list_empty(&bank->res->children)) {
+ start = PAGE_ALIGN(bank->res->start);
+ end = PAGE_ALIGN_DOWN(bank->res->end) - 1;
+ size = end - start + 1;
- /*
- * Check for address bits stuck high.
- */
- test_offset = 0;
- start[test_offset] = anti_pattern;
-
- for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
- temp = start[offset];
- if (temp != pattern) {
- printf ("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
- " expected 0x%.8lx, actual 0x%.8lx\n",
- (ulong)&start[offset], pattern, temp);
- return 1;
- }
- }
- start[test_offset] = pattern;
+ ret = alloc_memtest_region(list, start, size);
+ if (ret < 0)
+ return ret;
- /*
- * Check for addr bits stuck low or shorted.
- */
- for (test_offset = 1; (test_offset & addr_mask) != 0; test_offset <<= 1) {
- start[test_offset] = anti_pattern;
-
- for (offset = 1; (offset & addr_mask) != 0; offset <<= 1) {
- temp = start[offset];
- if ((temp != pattern) && (offset != test_offset)) {
- printf ("\nFAILURE: Address bit stuck low or shorted @"
- " 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
- (ulong)&start[offset], pattern, temp);
- return 1;
- }
- }
- start[test_offset] = pattern;
+ continue;
}
/*
- * Description: Test the integrity of a physical
- * memory device by performing an
- * increment/decrement test over the
- * entire region. In the process every
- * storage bit in the device is tested
- * as a zero and a one. The base address
- * and the size of the region are
- * selected by the caller.
- *
- * Returns: 0 if the test succeeds, 1 if the test fails.
+ * We assume that the regions are sorted in this list
+ * So the first element has start boundary on bank->res->start
+ * and the last element hast end boundary on bank->res->end
*/
- num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
-
- /*
- * Fill memory with a known pattern.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
- start[offset] = pattern;
+ list_for_each_entry(r, &bank->res->children, sibling) {
+ /*
+ * Do on head element for bank boundary
+ */
+ if (r->sibling.prev == &bank->res->children) {
+ /*
+ * remember last used element
+ */
+ start = PAGE_ALIGN(bank->res->start);
+ end = PAGE_ALIGN_DOWN(r->start) - 1;
+ size = end - start + 1;
+ r_prev = r;
+ if (start >= end)
+ continue;
+
+ ret = alloc_memtest_region(list, start, size);
+ if (ret < 0)
+ return ret;
+ continue;
+ }
+ /*
+ * Between used regions
+ */
+ start = PAGE_ALIGN(r_prev->end);
+ end = PAGE_ALIGN_DOWN(r->start) - 1;
+ size = end - start + 1;
+ r_prev = r;
+ if (start >= end)
+ continue;
+
+ ret = alloc_memtest_region(list, start, size);
+ if (ret < 0)
+ return ret;
+
+ if (list_is_last(&r->sibling, &bank->res->children)) {
+ /*
+ * Do on head element for bank boundary
+ */
+ start = PAGE_ALIGN(r->end);
+ end = PAGE_ALIGN_DOWN(bank->res->end) - 1;
+ size = end - start + 1;
+ if (start >= end)
+ continue;
+
+ ret = alloc_memtest_region(list, start, size);
+ if (ret < 0)
+ return ret;
+ }
}
+ }
- /*
- * Check each location and invert it for the second pass.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
- temp = start[offset];
- if (temp != pattern) {
- printf ("\nFAILURE (read/write) @ 0x%.8lx:"
- " expected 0x%.8lx, actual 0x%.8lx)\n",
- (ulong)&start[offset], pattern, temp);
- return 1;
- }
-
- anti_pattern = ~pattern;
- start[offset] = anti_pattern;
- }
+ return 0;
+}
- /*
- * Check each location for the inverted pattern and zero it.
- */
- for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
- anti_pattern = ~pattern;
- temp = start[offset];
- if (temp != anti_pattern) {
- printf ("\nFAILURE (read/write): @ 0x%.8lx:"
- " expected 0x%.8lx, actual 0x%.8lx)\n",
- (ulong)&start[offset], anti_pattern, temp);
- return 1;
- }
- start[offset] = 0;
- }
+static int __do_memtest(struct list_head *memtest_regions,
+ int bus_only, uint32_t cache_flag)
+{
+ struct mem_test_resource *r;
+ int ret;
+
+ list_for_each_entry(r, memtest_regions, list) {
+ printf("Testing memory space: "
+ "0x%08x -> 0x%08x:\n",
+ r->r->start, r->r->end);
+ remap_range((void *)r->r->start, r->r->end -
+ r->r->start + 1, cache_flag);
+
+ ret = mem_test(r->r->start, r->r->end, bus_only);
+ if (ret < 0)
+ return ret;
+ printf("done.\n\n");
}
+ return 0;
}
-#else
-static int mem_test(ulong _start, ulong _end, ulong pattern)
+
+static int do_memtest(int argc, char *argv[])
{
- vu_long *addr;
- vu_long *start = (vu_long *)_start;
- vu_long *end = (vu_long *)_end;
- ulong val;
- ulong readback;
- ulong incr;
- int rcode;
-
- incr = 1;
- for (;;) {
- if (ctrlc()) {
- putchar('\n');
- return 1;
+ int bus_only = 0, ret, opt;
+ uint32_t i, max_i = 1, pte_flags_cached, pte_flags_uncached;
+ struct mem_test_resource *r, *r_tmp;
+ struct list_head memtest_used_regions;
+
+ while ((opt = getopt(argc, argv, "i:b")) > 0) {
+ switch (opt) {
+ case 'i':
+ max_i = simple_strtoul(optarg, NULL, 0);
+ break;
+ case 'b':
+ bus_only = 1;
+ break;
+ default:
+ return COMMAND_ERROR_USAGE;
}
+ }
- printf ("\rPattern 0x%08lX Writing..."
- "%12s"
- "\b\b\b\b\b\b\b\b\b\b",
- pattern, "");
+ if (optind > argc)
+ return COMMAND_ERROR_USAGE;
- for (addr=start,val=pattern; addr<end; addr++) {
- *addr = val;
- val += incr;
- }
+ /*
+ * Get pte flags for enable and disable cache support on page.
+ */
+ pte_flags_cached = mmu_get_pte_cached_flags();
+ pte_flags_uncached = mmu_get_pte_uncached_flags();
- puts ("Reading...");
+ INIT_LIST_HEAD(&memtest_used_regions);
- for (addr=start,val=pattern; addr<end; addr++) {
- readback = *addr;
- if (readback != val) {
- printf ("\nMem error @ 0x%08X: "
- "found 0x%08lX, expected 0x%08lX\n",
- (uint)addr, readback, val);
- rcode = 1;
- }
- val += incr;
- }
+ ret = request_memtest_regions(&memtest_used_regions);
+ if (ret < 0)
+ goto out;
+ for (i = 1; (i <= max_i) || !max_i; i++) {
+ if (max_i)
+ printf("Start iteration %u of %u.\n", i, max_i);
/*
- * Flip the pattern each time to make lots of zeros and
- * then, the next time, lots of ones. We decrement
- * the "negative" patterns and increment the "positive"
- * patterns to preserve this feature.
+ * First try a memtest with caching enabled.
*/
- if(pattern & 0x80000000) {
- pattern = -pattern; /* complement & increment */
- }
- else {
- pattern = ~pattern;
+ if (IS_ENABLED(CONFIG_MMU)) {
+ printf("Do memtest with caching enabled.\n");
+ ret = __do_memtest(&memtest_used_regions,
+ bus_only, pte_flags_cached);
+ if (ret < 0)
+ goto out;
}
- incr = -incr;
+ /*
+ * Second try a memtest with caching disabled.
+ */
+ printf("Do memtest with caching disabled.\n");
+ ret = __do_memtest(&memtest_used_regions,
+ bus_only, pte_flags_uncached);
+ if (ret < 0)
+ goto out;
}
- return rcode;
-}
-#endif
-
-static int do_mem_mtest(int argc, char *argv[])
-{
- ulong start, end, pattern = 0;
- if (argc < 3)
- return COMMAND_ERROR_USAGE;
-
- start = simple_strtoul(argv[1], NULL, 0);
- end = simple_strtoul(argv[2], NULL, 0);
-
- if (argc > 3)
- pattern = simple_strtoul(argv[3], NULL, 0);
+out:
+ list_for_each_entry_safe(r, r_tmp, &memtest_used_regions, list) {
+ /*
+ * Ensure to leave with a cached on non used sdram regions.
+ */
+ remap_range((void *)r->r->start, r->r->end -
+ r->r->start + 1, pte_flags_cached);
+ release_sdram_region(r->r);
+ free(r);
+ }
- printf ("Testing 0x%08x ... 0x%08x:\n", (uint)start, (uint)end);
-
- return mem_test(start, end, pattern);
+ if (ret < 0) {
+ /*
+ * Set cursor to newline, because mem_test failed at
+ * drawing of progressbar.
+ */
+ if (ret == -EINTR)
+ printf("\n");
+
+ printf("Memtest failed.\n");
+ return 1;
+ } else {
+ printf("Memtest successful.\n");
+ return 1;
+ }
}
-static const __maybe_unused char cmd_mtest_help[] =
-"Usage: <start> <end> "
-#ifdef CONFIG_CMD_MTEST_ALTERNATIVE
-"[pattern]"
-#endif
-"\nsimple RAM read/write test\n";
-
-BAREBOX_CMD_START(mtest)
- .cmd = do_mem_mtest,
- .usage = "simple RAM test",
- BAREBOX_CMD_HELP(cmd_mtest_help)
-BAREBOX_CMD_END
+static const __maybe_unused char cmd_memtest_help[] =
+"Usage: memtest [OPTION]...\n"
+"memtest related commands\n"
+" -i <iterations> iterations [default=1, endless=0].\n"
+" -b perform only a test on buslines.";
+BAREBOX_CMD_START(memtest)
+ .cmd = do_memtest,
+ .usage = "Memory Test",
+ BAREBOX_CMD_HELP(cmd_memtest_help)
+BAREBOX_CMD_END
diff --git a/common/Makefile b/common/Makefile
index 34eb7e41ee..4f430b6ed1 100644
--- a/common/Makefile
+++ b/common/Makefile
@@ -18,6 +18,7 @@ obj-$(CONFIG_MALLOC_DLMALLOC) += dlmalloc.o
obj-$(CONFIG_MALLOC_TLSF) += tlsf_malloc.o
obj-$(CONFIG_MALLOC_TLSF) += tlsf.o
obj-$(CONFIG_MALLOC_DUMMY) += dummy_malloc.o
+obj-$(CONFIG_CMD_MEMTEST) += memtest.o
obj-y += clock.o
obj-$(CONFIG_BANNER) += version.o
obj-$(CONFIG_MEMINFO) += meminfo.o
diff --git a/common/memtest.c b/common/memtest.c
new file mode 100644
index 0000000000..22178cfea2
--- /dev/null
+++ b/common/memtest.c
@@ -0,0 +1,313 @@
+/*
+ * memory_test.c
+ *
+ * Copyright (c) 2013 Alexander Aring <aar@pengutronix.de>, Pengutronix
+ *
+ * (C) Copyright 2000
+ * Wolfgang Denk, DENX Software Engineering, wd@denx.de.
+ *
+ * See file CREDITS for list of people who contributed to this
+ * project.
+ *
+ * This program is free software; you can redistribute it and/or modify
+ * it under the terms of the GNU General Public License version 2
+ * as published by the Free Software Foundation.
+ *
+ * This program is distributed in the hope that it will be useful,
+ * but WITHOUT ANY WARRANTY; without even the implied warranty of
+ * MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
+ * GNU General Public License for more details.
+ *
+ */
+
+#include <progress.h>
+#include <common.h>
+#include <memory.h>
+#include <types.h>
+#include <sizes.h>
+#include <memtest.h>
+
+static const resource_size_t bitpattern[] = {
+ 0x00000001, /* single bit */
+ 0x00000003, /* two adjacent bits */
+ 0x00000007, /* three adjacent bits */
+ 0x0000000F, /* four adjacent bits */
+ 0x00000005, /* two non-adjacent bits */
+ 0x00000015, /* three non-adjacent bits */
+ 0x00000055, /* four non-adjacent bits */
+ 0xAAAAAAAA, /* alternating 1/0 */
+};
+
+/*
+ * Perform a memory test. The complete test
+ * loops until interrupted by ctrl-c.
+ *
+ * Prameters:
+ * start: start address for memory test.
+ * end: end address of memory test.
+ * bus_only: skip integrity check and do only a address/data bus
+ * testing.
+ *
+ * Return value can be -EINVAL for invalid parameter or -EINTR
+ * if memory test was interrupted.
+ */
+int mem_test(resource_size_t _start,
+ resource_size_t _end, int bus_only)
+{
+ volatile resource_size_t *start, *dummy, val, readback, offset,
+ offset2, pattern, temp, anti_pattern, num_words;
+ int i;
+
+ _start = ALIGN(_start, sizeof(resource_size_t));
+ _end = ALIGN_DOWN(_end, sizeof(resource_size_t)) - 1;
+
+ if (_end <= _start)
+ return -EINVAL;
+
+ start = (resource_size_t *)_start;
+ /*
+ * Point the dummy to start[1]
+ */
+ dummy = start + 1;
+ num_words = (_end - _start + 1)/sizeof(resource_size_t);
+
+ printf("Starting data line test.\n");
+
+ /*
+ * Data line test: write a pattern to the first
+ * location, write the 1's complement to a 'parking'
+ * address (changes the state of the data bus so a
+ * floating bus doen't give a false OK), and then
+ * read the value back. Note that we read it back
+ * into a variable because the next time we read it,
+ * it might be right (been there, tough to explain to
+ * the quality guys why it prints a failure when the
+ * "is" and "should be" are obviously the same in the
+ * error message).
+ *
+ * Rather than exhaustively testing, we test some
+ * patterns by shifting '1' bits through a field of
+ * '0's and '0' bits through a field of '1's (i.e.
+ * pattern and ~pattern).
+ */
+ for (i = 0; i < ARRAY_SIZE(bitpattern)/
+ sizeof(resource_size_t); i++) {
+ val = bitpattern[i];
+
+ for (; val != 0; val <<= 1) {
+ *start = val;
+ /* clear the test data off of the bus */
+ *dummy = ~val;
+ readback = *start;
+ if (readback != val) {
+ printf("FAILURE (data line): "
+ "expected 0x%08x, actual 0x%08x at address 0x%08x.\n",
+ val, readback, (resource_size_t)start);
+ return -EIO;
+ }
+
+ *start = ~val;
+ *dummy = val;
+ readback = *start;
+ if (readback != ~val) {
+ printf("FAILURE (data line): "
+ "Is 0x%08x, should be 0x%08x at address 0x%08x.\n",
+ readback,
+ ~val, (resource_size_t)start);
+ return -EIO;
+ }
+ }
+ }
+
+
+ /*
+ * Based on code whose Original Author and Copyright
+ * information follows: Copyright (c) 1998 by Michael
+ * Barr. This software is placed into the public
+ * domain and may be used for any purpose. However,
+ * this notice must not be changed or removed and no
+ * warranty is either expressed or implied by its
+ * publication or distribution.
+ */
+
+ /*
+ * Address line test
+ *
+ * Description: Test the address bus wiring in a
+ * memory region by performing a walking
+ * 1's test on the relevant bits of the
+ * address and checking for aliasing.
+ * This test will find single-bit
+ * address failures such as stuck -high,
+ * stuck-low, and shorted pins. The base
+ * address and size of the region are
+ * selected by the caller.
+ *
+ * Notes: For best results, the selected base
+ * address should have enough LSB 0's to
+ * guarantee single address bit changes.
+ * For example, to test a 64-Kbyte
+ * region, select a base address on a
+ * 64-Kbyte boundary. Also, select the
+ * region size as a power-of-two if at
+ * all possible.
+ *
+ * ## NOTE ## Be sure to specify start and end
+ * addresses such that num_words has
+ * lots of bits set. For example an
+ * address range of 01000000 02000000 is
+ * bad while a range of 01000000
+ * 01ffffff is perfect.
+ */
+
+ pattern = 0xAAAAAAAA;
+ anti_pattern = 0x55555555;
+
+ /*
+ * Write the default pattern at each of the
+ * power-of-two offsets.
+ */
+ for (offset = 1; offset <= num_words; offset <<= 1)
+ start[offset] = pattern;
+
+ printf("Check for address bits stuck high.\n");
+
+ /*
+ * Check for address bits stuck high.
+ */
+ for (offset = 1; offset <= num_words; offset <<= 1) {
+ temp = start[offset];
+ if (temp != pattern) {
+ printf("FAILURE: Address bit "
+ "stuck high @ 0x%08x:"
+ " expected 0x%08x, actual 0x%08x.\n",
+ (resource_size_t)&start[offset],
+ pattern, temp);
+ return -EIO;
+ }
+ }
+
+ printf("Check for address bits stuck "
+ "low or shorted.\n");
+
+ /*
+ * Check for address bits stuck low or shorted.
+ */
+ for (offset2 = 1; offset2 <= num_words; offset2 <<= 1) {
+ start[offset2] = anti_pattern;
+
+ for (offset = 1; offset <= num_words; offset <<= 1) {
+ temp = start[offset];
+
+ if ((temp != pattern) &&
+ (offset != offset2)) {
+ printf("FAILURE: Address bit stuck"
+ " low or shorted @"
+ " 0x%08x: expected 0x%08x, actual 0x%08x.\n",
+ (resource_size_t)&start[offset],
+ pattern, temp);
+ return -EIO;
+ }
+ }
+ start[offset2] = pattern;
+ }
+
+ /*
+ * We tested only the bus if != 0
+ * leaving here
+ */
+ if (bus_only)
+ return 0;
+
+ printf("Starting integrity check of physicaly ram.\n"
+ "Filling ram with patterns...\n");
+
+ /*
+ * Description: Test the integrity of a physical
+ * memory device by performing an
+ * increment/decrement test over the
+ * entire region. In the process every
+ * storage bit in the device is tested
+ * as a zero and a one. The base address
+ * and the size of the region are
+ * selected by the caller.
+ */
+
+ /*
+ * Fill memory with a known pattern.
+ */
+ init_progression_bar(num_words);
+ for (offset = 0; offset < num_words; offset++) {
+ /*
+ * Every 4K we update the progressbar.
+ */
+ if (!(offset & (SZ_4K - 1))) {
+ if (ctrlc())
+ return -EINTR;
+ show_progress(offset);
+ }
+
+ start[offset] = offset + 1;
+ }
+ show_progress(offset);
+
+ printf("\nCompare written patterns...\n");
+ /*
+ * Check each location and invert it for the second pass.
+ */
+ init_progression_bar(num_words - 1);
+ for (offset = 0; offset < num_words; offset++) {
+ if (!(offset & (SZ_4K - 1))) {
+ if (ctrlc())
+ return -EINTR;
+ show_progress(offset);
+ }
+
+ temp = start[offset];
+ if (temp != (offset + 1)) {
+ printf("\nFAILURE (read/write) @ 0x%08x:"
+ " expected 0x%08x, actual 0x%08x.\n",
+ (resource_size_t)&start[offset],
+ (offset + 1), temp);
+ return -EIO;
+ }
+
+ anti_pattern = ~(offset + 1);
+ start[offset] = anti_pattern;
+ }
+ show_progress(offset);
+
+ printf("\nFilling ram with inverted pattern and compare it...\n");
+ /*
+ * Check each location for the inverted pattern and zero it.
+ */
+ init_progression_bar(num_words - 1);
+ for (offset = 0; offset < num_words; offset++) {
+ if (!(offset & (SZ_4K - 1))) {
+ if (ctrlc())
+ return -EINTR;
+ show_progress(offset);
+ }
+
+ anti_pattern = ~(offset + 1);
+ temp = start[offset];
+
+ if (temp != anti_pattern) {
+ printf("\nFAILURE (read/write): @ 0x%08x:"
+ " expected 0x%08x, actual 0x%08x.\n",
+ (resource_size_t)&start[offset],
+ anti_pattern, temp);
+ return -EIO;
+ }
+
+ start[offset] = 0;
+ }
+ show_progress(offset);
+
+ /*
+ * end of progressbar
+ */
+ printf("\n");
+
+ return 0;
+}
diff --git a/include/common.h b/include/common.h
index 59fcd35ac1..fc2c8ca8be 100644
--- a/include/common.h
+++ b/include/common.h
@@ -182,8 +182,9 @@ int run_shell(void);
#define BUILD_BUG_ON_ZERO(e) (sizeof(struct { int:-!!(e); }))
#define BUILD_BUG_ON_NULL(e) ((void *)sizeof(struct { int:-!!(e); }))
-#define ALIGN(x,a) __ALIGN_MASK(x,(typeof(x))(a)-1)
-#define __ALIGN_MASK(x,mask) (((x)+(mask))&~(mask))
+#define ALIGN(x, a) __ALIGN_MASK(x, (typeof(x))(a) - 1)
+#define __ALIGN_MASK(x, mask) (((x) + (mask)) & ~(mask))
+#define ALIGN_DOWN(x, a) ((x) & ~((typeof(x))(a) - 1))
#define PTR_ALIGN(p, a) ((typeof(p))ALIGN((unsigned long)(p), (a)))
#define IS_ALIGNED(x, a) (((x) & ((typeof(x))(a) - 1)) == 0)
diff --git a/include/memtest.h b/include/memtest.h
new file mode 100644
index 0000000000..a337be832f
--- /dev/null
+++ b/include/memtest.h
@@ -0,0 +1,14 @@
+#ifndef __MEMTEST_H
+#define __MEMTEST_H
+
+#include <linux/ioport.h>
+
+struct mem_test_resource {
+ struct resource *r;
+ struct list_head list;
+};
+
+int mem_test(resource_size_t _start,
+ resource_size_t _end, int bus_only);
+
+#endif /* __MEMTEST_H */